For characterizing precision-manufactured and functional or sophisticated surfaces in detail and 3D, it requires measurement technology that is reliable, fast and precise. Guaranteeing functionality and detecting defects at an early stage avoids unnecessary cost and increases the overall product quality and lifetime. TopMap from Polytec addresses surface metrology applications with innovative, high-precision, non-contact optical technology that works on rough, smooth and stepped surfaces. White-light interferometers of the TopMap sensor family are established optical quality inspection tools for the controls laboratory, in production environments or in-line.

TopMap Micro.View

TopMap Micro.View® is an easy to use and compact optical profiler. Choose Micro.View® as the cost-effective quality control solution for surface analysis of precision-engineering, for inspecting roughness, microstructures and more surface details

TopMap Micro.View+

TopMap Micro.View®+ is the next generation optical surface profiler in a modular design to reliably measure the most challenging analysis tasks regarding surface finish and microstructures with utmost precision. Focus Finder and Focus Tracker assist in keeping samples focused at all times, with fully motorized positioning units ready for automation

TopMap Pro.Surf

Ideal for quick and precise 3D surface characterization. The TopMap Pro.Surf quickly, reliably and precisely determines form deviation. The TopMap Pro.Surf offers the customized solution for all surface characterization requirements using parameters such as flatness, step heights and parallelism. All in all, the spatial resolution, the telecentric optics and the outstanding speed and performance cut a very impressive figure indeed.

TopMap Pro.Surf+

The all-in-one 3D optical surface profiler from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf+ measures topography over a large area and, in so doing, characterizes structures with nanometer resolution.

TopMap Metro.Lab

Being a complete measuring station, the TopMap Metro.Lab is ideally suited to large-area topographies on almost all surfaces. Since it offers great value for money, it is also attractive for smaller companies with fewer tasks.